Results from FEB Electronics Radiation Tests in 63 MeV p Beam at Davis April 4-9, 2000

 

16-Channel Buckeye ASIC

Digital Monitoring:

calibration bits are continuously shifted through irradiated Buckeye. Stored bits are checked as well as shifting function

Analog Monitoring:

the Buckeye is externally pulsed at 6 voltage settings every 10 seconds

 

Results (1st Chip, 6 Runs): Total Fluence 2.28x1012 p/cm2 Total TID 307 KRads

  1. No Latch-up
  2. No Shift Errors
  3. Supply current increased from 100mA to 220mA starting at about 40 Krads
  4. Buckeye gain decreases from 3250 down to 1150 in 300 KRad (see buckeye.pdf ) after 3 Hrs of annealing gain improves back to 1400.
  5. Current to Buckeye chip increases from 100mA to 160 mA at 80 Krads then 200mA at 146 Krads.

 

SCA Master FPGA (XLINX Spartan XCS30XL)

Digital Monitoring:

Capacitor blocks are read back and future blocks are predicted assuming blocks are in grey code order. Blocks alternate 0123 4567 0123 4567 … SCA read address are readout in the data stream and checked. SCA write addresses are readout in the data stream and checked.

Results (1st chip 2 runs 1.05 hrs):Total Fluence 9.9x1010 p/cm2

  1. No Latch-up observed
  2. There are about 16 observed changes in the configuration memory due to radiation effects for each true controller interupt. The configuration changes seem to have no effect on the working of the chip. About 70% of Mux controller errors are associated with a change in configuration memory.
  3. The SCA control was interrupted 27 times. 26 of the interrupts required full reprogramming of the chip to recover. Four of these interrupts required ~1 second before the chip was properly reprogrammed. Interrupt interval:

time=9.9x1010/6.0x1011*5.0x107=8.25x106 LHC seconds

8.25x106/27=300,000 s/interrupt

 

MUX FPGA (XLINX Spartan XCS30XL)

Digital Monitoring:

Same program used to monitor the SCA master controller is used here.

Results (1st chip 4 runs 1.05 hrs):Total Fluence 1.0x1011 p/cm2

  1. No Latch-up observed
  2. Configuration memory changes due to radiation seem to take place 30 times more often than true Mux controller errors. About 70% of Mux controller errors are associated with a change in configuration memory.
  3. The MUX control was interrupted 12 times. All 12 of the interrupts required full reprogramming of the chip to recover. Interrupt interval:
  4. time=1.0x1011/6.0x1011*5.0x107=8.33x106 LHC seconds

    8.33x106/12=700,000 s/interrupt

  5. Configuration errors (~2000/249111 bits) start happening at end of running (13.3 Krad). These are not cleared by resets.

Results (same chip 2 runs 2.05 hrs):Total Fluence 1.82x1011 p/cm2

  1. No Latch-up observed
  2. The MUX control was interrupted 22 times. All 22 of the interrupts required full reprogramming of the chip to recover. Interrupt interval:
  3. time=1.82x1011/6.0x1011*5.0x107=1.5x107 LHC seconds

    1.5x107/22=700,000 s/interrupt

  4. After 10 Krads (additional dose) configuration errors go through the ceiling (~200,000/249111 bits). These are not cleared by resets. They also don't seem to effect the chip functioning. First run stops when MUX stops working (22.2 Krad additional dose). After waiting ~2hrs mux recovers and second run is taken. 

CPLD (XLINX CPLD XC9536XL)

Digital Monitoring:

Same program used to monitor the SCA master controller is used here.

 

Results (1st chip 3 runs 1.05 hrs): Total Fluence 2.8x1011 p/cm2 Total TID 47.2 Krad

  1. No Latch-up observed
  2. No configuration errors were observed.
  3. The CPLD control was interrupted 106 times. All 106 of the interrupts required full reprogramming of the chip to recover. Interrupt interval:
  4. time=2.8x1011/6.0x1011*5.0x107=2.33x107 LHC seconds

    2.33x107/106=200,000 s/interrupt

  5. The CPLD died after 55 minutes (47.2 Krad) and replaced on the next morning.

 

Results (chip 2 runs 1.0 hrs): Total Fluence 3.06x1011 p/cm2 Total TID 41.28 Krad

  1. No Latch-up observed
  2. No configuration errors were observed
  3. The CPLD control was interrupted 117 times. All 117 of the interrupts required full reprogramming of the chip to recover. Interrupt interval:
  4. time=3.06x1011/6.0x1011*5.0x107=2.55x107 LHC seconds

    2.55x107/117=200,000 s/interrupt

  5. The CPLD died after 60 minutes (41.28 Krad) but a broken cable wire was discovered the next morning, and the CPLD works OK, so this may not be due to radiation.

 

UCLA DAC (Threshold for Trigger Discriminator)

Monitoring:

The 12 bit DAC analog output is looped back into the 8 bit thermometer ADC on the Motherboard. The DAC is set to 10 separate voltages (V=1.0*k/4096 where k=0,16,32,64,128,256,512,1024,2048,4095)and the output is readout through the 8 bit thermometer.

Results (1st chip 3 runs 4.0 mins): Total TID 62.5 Krad High Dose Rate (228.75 Rad/s)

  1. No Latch-up
  2. DAC shows problems at 20Krad. Does not recover fully by next morning so it is replaced.

Results (2nd chip 3 runs 50 mins): Total TID 36.3 Krad Low Dose Rate (23 Rad/s)

  1. No Latch-up
  2. DAC shows no problems. Out of ~10000 measurements during this run only once was the input output difference greater than 5 mV. In single case it was shifted by 7 mV.

 

ADC

Monitoring:

Data is continually taken using the external pulser. Six voltage levels are used for each of the 16 channels in the single Buckeye read out.

Results (1st chip 3 runs 35 mins): Total TID 36 Krad

  1. No Latch-up
  2. No ADC problems were observed in this run. To look for analog problems see the plot of peak pulse heights for 16 channels versus dose in KRads(click on adc.pdf). To look for stuck bits see individual plots of the number of 1's out of 80 samples for each of 12 ADC bits versus dose in Krads(click on adc2.pdf).

 

Analog Thermometer

Monitoring:

Thermometer is read out through the DAQ every 1 second.

Results (1st chip 1 run 8.0 mins): Total TID 10.0 Krad

1. Thermometer breaks rising from 80oF to 90oF. It has stayed at 90oF ever since (see plot of temperature versus dose in Krads, therm.pdf).

 

Channel Link

Monitoring:

Data is continually taken using the external pulser pulsed at 2.5 volts and only checksums are checked. Data is read in at 2 Mbytes/s. Readout is capable of 80 Mbytes/s so that the readout is only 2.5% live. We would see long term SEI's only. We will do a better test of the channel links next time in the beam.

Results (1st chip 2 runs 33 mins): Total Fluence 1.4x1011 p/cm2 Total TID 20 Krad

  1. No Latch-up
  2. 2 shift errors were seen during this period.

 

Davis SCA

Monitoring:

the Buckeye is externally pulsed at 6 voltage settings every 2 seconds.

Results (1st chip 4 runs 108 mins): Total Fluence 4.82x1011 p/cm2 Total TID 65 Krad

  1. No Latch-up
  2. No ADC problems were observed in this run. To look for analog problems see the plot of peak pulse heights for 16 channels versus dose in Krads (click on sca.pdf). Note this plot has two long runs taken two days apart.

 

 XILINX VIRTEX FPGA (XCV150-pq240-4c)

Monitoring:

The DRAM, FLIP-FLOP, COUNTER, AND/OR gate logic are implemented in the FPGA, read back configuration bit and compare, read the logic error through JTAG path.

Results (1st chip 7 runs ~3 hours): Total Fluence 6.4x1011 p/cm2 Total TID 86 Krad

  1. Configuration bit flip and Block RAM bit flip rate is proportional to proton beam current, configure bit error is 100bit/70second, Block RAM bit flip 25bit/70second at 500pA. This is equivalent to 4hr/bit at LHC run. The power supply current increase suddenly at 60Krad from 93mA to 300mA and slowly went down to normal over about 5 minutes. At 78 Krad, the current draw is more than 1A (limit of power supply). Check the resistance from power to ground, it is MegaOhms. 

Results (2st chip 2 runs ~100 mins): Total Fluence 9.8x1011 p/cm2 Total TID 131 Krad

  1. Similar configuration bit flip and Block RAM bit flip error rate. The power supply current increased to over 250mA at 60Krad and 500mA at 65Krad, and slowly decreased to 250mA after 2~3 minutes. And the current jumped to 930mA at 111Krad and dropped to 400mA after JTAG reprogramming. There are 3000 bits permanent configuration error. At 120Krad, current jumped to 1A (limit of power supply). After cycled the power, the current back to 600mA, but it surpassed the current limit when reprogramming it.
  2. For both chips, the configuration bit flip is random as to FRAME, WORD, BIT. And the permanent bit error on 2nd chip is also random. There are readback problem and JTAG path problem, so the functional error rate is not given.
  3. As a comparison, the SPARTAN XCS30XL (MUX FPGA, run 13) had 627 bit flip in 1 hour at 150pA proton beam, which is about the same rate as VIRTEX.