ENCOMM NanoSystems Laboratory (ENSL)
Helios NanoLab 600 FIB
Dual electron and Ion beam
- Electron imaging (0.7 nm @ 15 kV)
- Ion beam machining (5 nm @ 30 kV)
E-beam lithography
X-ray EDS spectrometer
- compositional analysis with resolution down to 30 nm
Platinum deposition
- Other materials are possible
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