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| Chris Hammel |
| Departments of Physics, and Electrical and Computer Engineering, and Ohio Eminent Scholar |
2000 Physics Research Building |
| 191 W. Woodruff Avenue |
| 614-247-6928 |
| Contact Professor Hammel |
| Research web page for Professor Hammel |
We study the electronic, magnetic and superconducting properties of materials including multicomponent magnetic materials and novel spin-electronic systems using the Magnetic Resonance Force Microscope--a scanned probe magnetic resonance microscope that employs mechanical detection to achieve exceptional detection sensitivity and very high spatial resolution. This technique offers near single electron spin sensitivity in scanned studies of nanoscale ferromagnets and patterned semiconductors and metals. Ultrasensitive force detection also opens new possibilities for magnetic force microscopy of nanoscale magnetic systems.
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